644 search results - page 7 / 129 » An Experimental Chip to Evaluate Test Techniques: Experiment... |
110
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ICST
2009
IEEE
14 years 9 months ago
2009
IEEE
This paper reports an empirical evaluation of four blackbox testing techniques for crashing programs through their GUI interface: SH, AF, DH, and BxT. The techniques vary in their...
113
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ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
14 years 9 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
102
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ICST
2009
IEEE
14 years 9 months ago
2009
IEEE
Measurement and detection of redundancy in test suites attempt to achieve test minimization which in turn can help reduce test maintenance costs, and to also ensure the integrity ...
JSS
2000
14 years 11 months ago
2000
This paper presents the results of a study where the effects of introducing code reviews in an organisational unit have been evaluated. The study was performed in an ongoing comme...
116
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TRIDENTCOM
2008
IEEE
15 years 6 months ago
2008
IEEE
The MeshTest testbed is designed to subject wireless devices and protocols to realistic and repeatable mobile scenarios, including multi-hop and disconnected topologies. The testb...