214 search results - page 30 / 43 » An Experimental Evaluation on Reliability Features of N-Vers... |
124
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TCAD
2010
14 years 4 months ago
2010
Abstract--In double patterning lithography (DPL) layout decomposition for 45nm and below process nodes, two features must be assigned opposite colors (corresponding to different ex...
97
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ENTCS
2007
14 years 9 months ago
2007
Recently, we proposed a general framework for the cost analysis of Java bytecode which can be used for measuring resource usage. This analysis generates, at compile-time, cost rel...
163
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ICFP
2009
ACM
15 years 10 months ago
2009
ACM
Concurrent ML (CML) is a high-level message-passing language that supports the construction of first-class synchronous abstractions called events. This mechanism has proven quite ...
108
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ISSTA
2012
ACM
12 years 12 months ago
2012
ACM
To keep a Graphical User Interface (GUI) responsive and active, a GUI application often has a main UI thread (or event dispatching thread) and spawns separate threads to handle le...
DCC
2007
IEEE
15 years 9 months ago
2007
IEEE
Instruction and data address traces are widely used by computer designers for quantitative evaluations of new architectures and workload characterization, as well as by software de...