706 search results - page 109 / 142 » An Integer Linear Programming Approach to Database Design |
CONSTRAINTS
2007
14 years 11 months ago
2007
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
BROADNETS
2005
IEEE
15 years 4 months ago
2005
IEEE
— Networks employ link protection to achieve fast recovery from link failures. While the first link failure can be protected using link protection, there are several alternative...
ASPDAC
2006
ACM
15 years 5 months ago
2006
ACM
— The rapid increase in IC design complexity and wide-spread use of intellectual-property (IP) blocks have made the so-called mixed-size placement a very important topic in recen...
IPPS
2002
IEEE
15 years 4 months ago
2002
IEEE
In this paper we present new approaches to high performance protein database scanning on two novel massively parallel architectures to gain supercomputer power at low cost. The ...
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DATE
2008
IEEE
15 years 5 months ago
2008
IEEE
Leakage power is a serious concern in nanometer CMOS technologies. In this paper we focus on leakage reduction through automatic insertion of sleep transistors for power gating in...