The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
Abstract. While the efficiency and scalability of modern SAT technology offers an intriguing alternative approach to constraint solving via translation to SAT, previous work has mo...
Significant advances have been made in the last two decades for the effective solution of mixed integer non-linear programming (MINLP) problems, mainly by exploiting the special s...
—As the VLSI manufacturing technology advances into the deep sub-micron(DSM) era, the mask cost can reach one or two million dollars. Multiple project wafers (MPW) which put diï¬...
The pervasiveness and operational autonomy of mesh-based wireless sensor networks (WSNs) make them an ideal candidate in offering sustained monitoring functions at reasonable cost...
Rick W. Ha, Pin-Han Ho, Sherman X. Shen, Junshan Z...