177 search results - page 15 / 36 » An Interconnect Energy Model Considering Coupling Effects |
DATE
2002
IEEE
15 years 2 months ago
2002
IEEE
As technology scales toward deep submicron, on-chip interconnects are becoming more and more sensitive to noise sources such as power supply noise, crosstalk, radiation induced ef...
103
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INFOCOM
2006
IEEE
15 years 3 months ago
2006
IEEE
— Gupta and Kumar showed that throughput in a static random wireless network increases with the amount of hopping. In a subsequent paper (2004), it was shown that although throug...
ICCAD
2006
IEEE
15 years 6 months ago
2006
IEEE
With the continued scaling of CMOS technologies and reduced design margins, the reliability concerns induced by transient faults have become prominent. Moreover, the popular energ...
85
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WSC
2001
14 years 11 months ago
2001
Recent advances in low-power embedded processors, radios, and micro-mechanical systems (MEMs) have made possible the development of networks of wirelessly interconnected sensors. ...
GI
2007
Springer
15 years 3 months ago
2007
Springer
: Utility companies worldwide are facing a multitude of new challenges, which can not be met with the historically grown, monolithic IT systems currently in use. Service oriented a...