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DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
15 years 4 months ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
LCN
2008
IEEE
15 years 4 months ago
2008
IEEE
Abstract—Active measurements on network paths provide endto-end network health status in terms of metrics such as bandwidth, delay, jitter and loss. Hence, they are increasingly ...
DLOG
2010
14 years 8 months ago
2010
Abstract. Inconsistency and incoherency are two sorts of erroneous information in a DL ontology which have been widely discussed in ontology-based applications. For example, they h...
GLOBECOM
2008
IEEE
15 years 4 months ago
2008
IEEE
Abstract—In multi-user multiple-input multiple-output (MUMIMO) systems, channel state information at the transmitter (CSIT) allows for multi-user spatial multiplexing and thus in...
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E2EMON
2006
IEEE
15 years 4 months ago
2006
IEEE
Abstract— In our previous studies, we proposed ImTCP, an inline network measurement technique that can obtain available bandwidth information of the network path between sender a...