94 search results - page 17 / 19 » An analysis of developer metrics for fault prediction |
CODES
2003
IEEE
15 years 2 months ago
2003
IEEE
The analysis of the amount of human resources required to complete a project is felt as a critical issue in any company of the electronics industry. In particular, early estimatin...
EMSOFT
2004
Springer
15 years 3 months ago
2004
Springer
Performance is an important quality attribute that needs to be and managed proactively. Abstract models of the system are not very useful if they do not produce reasonably accurat...
BMCBI
2006
14 years 9 months ago
2006
Background: Recursive Feature Elimination is a common and well-studied method for reducing the number of attributes used for further analysis or development of prediction models. ...
VLSID
2006
IEEE
15 years 3 months ago
2006
IEEE
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
DAC
2007
ACM
15 years 10 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...