1728 search results - page 121 / 346 » An approach to integration testing based on architectural de... |
DAC
2006
ACM
15 years 11 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
DAC
2010
ACM
15 years 1 months ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
KBSE
2000
IEEE
15 years 2 months ago
2000
IEEE
Although peripheral devices come out at a frantic pace and require fast releases of drivers, little progress has been made to improve the development of drivers. Too often, this d...
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CORR
2012
Springer
13 years 5 months ago
2012
Springer
In the perspective of a sustainable urban planning, it is necessary to investigate cities in a holistic way and to accept surprises in the response of urban environments to a part...
IEAAIE
2003
Springer
15 years 3 months ago
2003
Springer
Integration of heterogeneous statistics is essential for political decision making on all levels. Like in intelligent information integration in general, the problem is to combine ...