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APPROX
2007
Springer
14 years 13 days ago
2007
Springer
abstract Manor Mendel1 and Assaf Naor2 1 The Open University of Israel 2 Courant Institute Let (X, dX ) be an n-point metric space. We show that there exists a distribution D over ...
DAC
2009
ACM
13 years 11 months ago
2009
ACM
Process scaling has given designers billions of transistors to work with. As feature sizes near the atomic scale, extensive variation and wearout inevitably make margining unecono...