Post-silicon validation has recently drawn designers' attention due to its increasing impacts on the VLSI design cycle and cost. One key feature of the post-silicon validatio...
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
Power consumption of system-level on-chip communications is becoming more significant in the overall system-on-chip (SoC) power as technology scales down. In this paper, we propos...
Renshen Wang, Nan-Chi Chou, Bill Salefski, Chung-K...
At runtime, an embedded control system can switch between alternative functional modes. In each mode, the system operates by using a schedule and controllers that exploit the avai...
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...