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MICRO
2007
IEEE
150views Hardware» more  MICRO 2007»
15 years 4 months ago
Leveraging 3D Technology for Improved Reliability
Aggressive technology scaling over the years has helped improve processor performance but has caused a reduction in processor reliability. Shrinking transistor sizes and lower sup...
Niti Madan, Rajeev Balasubramonian
LOPSTR
2005
Springer
15 years 3 months ago
Declarative Programming with Function Patterns
We propose an extension of functional logic languages that allows the definition of operations with patterns containing other defined operation symbols. Such “function patterns...
Sergio Antoy, Michael Hanus
CSCW
2004
ACM
15 years 3 months ago
Learning from project history: a case study for software development
The lack of lightweight communication channels and other technical and sociological difficulties make it hard for new members of a non-collocated software development team to lea...
Davor Cubranic, Gail C. Murphy, Janice Singer, Kel...
ISSRE
2003
IEEE
15 years 3 months ago
Reducing wasted development time via continuous testing
Testing is often performed frequently during development to ensure software reliability by catching regression errors quickly. However, stopping frequently to test also wastes tim...
David Saff, Michael D. Ernst
KDD
2010
ACM
252views Data Mining» more  KDD 2010»
15 years 1 months ago
Fast query execution for retrieval models based on path-constrained random walks
Many recommendation and retrieval tasks can be represented as proximity queries on a labeled directed graph, with typed nodes representing documents, terms, and metadata, and labe...
Ni Lao, William W. Cohen
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