72 search results - page 2 / 15 » An improved RF loopback for test time reduction |
73
Voted
ICSM
2005
IEEE
15 years 5 months ago
2005
IEEE
Software testing is a critical part of software development. Test suite sizes may grow significantly with subsequent modifications to the software over time. Due to time and res...
DATE
2008
IEEE
15 years 6 months ago
2008
IEEE
This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for th...
94
Voted
ISVLSI
2008
IEEE
15 years 6 months ago
2008
IEEE
Re-using the network in a NoC-based system as a test access mechanism is an attractive solution as pointed out by several authors. As a consequence, testing of NoC-based SoCs is b...
95
Voted
WSC
1998
1998
Effective Implementation of Cycle Time Reduction Strategies for Semiconductor Back-end Manufacturing
15 years 29 days ago
Using discrete-event simulation models, a study was conducted to evaluate the current production practices of a high-volume semiconductor back-end operation. The overall goal was ...
CEC
2007
IEEE
15 years 6 months ago
2007
IEEE
— Hypervolume based multiobjective evolutionary algorithms (MOEA) nowadays seem to be the first choice when handling multiobjective optimization problems with many, i.e., at lea...