72 search results - page 3 / 15 » An improved RF loopback for test time reduction |
SAC
2009
ACM
15 years 6 months ago
2009
ACM
Software developers use testing to gain and maintain confidence in the correctness of a software system. Automated reduction and prioritization techniques attempt to decrease the...
ISQED
2010
IEEE
15 years 4 months ago
2010
IEEE
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...
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LCTRTS
2009
Springer
15 years 6 months ago
2009
Springer
Register file (RF) is extremely vulnerable to soft errors, and traditional redundancy based schemes to protect the RF are prohibitive not only because RF is often in the timing c...
JMLR
2010
14 years 6 months ago
2010
Imitation Learning, while applied successfully on many large real-world problems, is typically addressed as a standard supervised learning problem, where it is assumed the trainin...
ICCD
2004
IEEE
15 years 8 months ago
2004
IEEE
Although scan-based designs are widely used in order to reduce the complexity of test generation, test application time and test data volume are substantially increased. We propos...