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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
15 years 3 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
PAA
2008
14 years 11 months ago
Prototype reduction using an artificial immune model
Artificial immune system (AIS)-based pattern classification approach is relatively new in the field of pattern recognition. The study explores the potentiality of this paradigm in ...
Utpal Garain
EMNLP
2007
15 years 1 months ago
Improving Translation Quality by Discarding Most of the Phrasetable
It is possible to reduce the bulk of phrasetables for Statistical Machine Translation using a technique based on the significance testing of phrase pair co-occurrence in the para...
Howard Johnson, Joel D. Martin, George F. Foster, ...
ICPR
2008
IEEE
15 years 6 months ago
Kernel Bisecting k-means clustering for SVM training sample reduction
This paper presents a new algorithm named Kernel Bisecting k-means and Sample Removal (KBK-SR) as a sampling preprocessing for SVM training to improve the scalability. The novel c...
Xiao-Zhang Liu, Guo-Can Feng
ISCA
2003
IEEE
107views Hardware» more  ISCA 2003»
15 years 4 months ago
Positional Adaptation of Processors: Application to Energy Reduction
Although adaptive processors can exploit application variability to improve performance or save energy, effectively managing their adaptivity is challenging. To address this probl...
Michael C. Huang, Jose Renau, Josep Torrellas