72 search results - page 7 / 15 » An improved RF loopback for test time reduction |
172
click to vote
BCS
2008
15 years 1 months ago
2008
: The SIFT algorithm (Scale Invariant Feature Transform) proposed by Lowe [1] is an approach for extracting distinctive invariant features from images. It has been successfully app...
102
click to vote
RECOMB
2005
Springer
15 years 12 months ago
2005
Springer
Recombination is an important evolutionary mechanism responsible for the genetic diversity in humans and other organisms. Recently, there has been extensive research on understandi...
ICCAD
1996
IEEE
15 years 3 months ago
1996
IEEE
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
100
Voted
ICMCS
2005
IEEE
15 years 5 months ago
2005
IEEE
In video coding, certain limitations imposed by the environment, most typically the bit rate, need to be fulfilled. This is achieved by allowing the encoder to reduce the quality ...
101
click to vote
DAC
2005
ACM
15 years 1 months ago
2005
ACM
This paper presents a new method for designing test wrappers for embedded cores with multiple clock domains. By exploiting the use of multiple shift frequencies, the proposed meth...