72 search results - page 9 / 15 » An improved RF loopback for test time reduction |
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ICCBR
2007
Springer
15 years 5 months ago
2007
Springer
Abstract. Case retrieval from a clustered case memory consists in finding out the clusters most similar to the new input case, and then retrieving the cases from them. Although th...
BMCBI
2006
14 years 11 months ago
2006
Background: Recursive Feature Elimination is a common and well-studied method for reducing the number of attributes used for further analysis or development of prediction models. ...
RTSS
2003
IEEE
15 years 4 months ago
2003
IEEE
This paper presents a quantification of the timing effects that advanced processor features like data and instruction cache, pipelines, branch prediction units and out-oforder ex...
ASPDAC
2008
ACM
15 years 1 months ago
2008
ACM
Power dissipation is quickly becoming one of the most important limiters in nanometer IC design for leakage increases exponentially as the technology scaling down. However, power ...
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ATS
2004
IEEE
15 years 3 months ago
2004
IEEE
In this paper, we propose a low-power testing methodology for the scan-based BIST. A smoother is included in the test pattern generator (TPG) to reduce average power consumption d...