Sciweavers

135 search results - page 10 / 27
» Analog circuit test based on a digital signature
Sort
View
ITC
1996
IEEE
107views Hardware» more  ITC 1996»
15 years 1 months ago
Digital Integrated Circuit Testing using Transient Signal Analysis
A novel approach to testing CMOS digital circuits is presented that is based on an analysis of IDD switching transients on the supply rails and voltage transients at selected test...
James F. Plusquellic, Donald M. Chiarulli, Steven ...
CODES
2005
IEEE
15 years 3 months ago
System-level design automation tools for digital microfluidic biochips
Biochips based on digital microfluidics offer a powerful platform for massively parallel biochemical analysis such as clinical diagnosis and DNA sequencing. Current full-custom de...
Krishnendu Chakrabarty, Fei Su
ET
2007
69views more  ET 2007»
14 years 9 months ago
Oscillator-Based Reconfigurable Sinusoidal Signal Generator for ADC BIST
Abstract In order to perform an on-chip test for characterizing both static and transmission parameters of embedded analog-to-digital converters (ADCs), this paper presents an osci...
Hsin-Wen Ting, Cheng-Wu Lin, Bin-Da Liu, Soon-Jyh ...
ASPDAC
2010
ACM
163views Hardware» more  ASPDAC 2010»
14 years 7 months ago
A PUF design for secure FPGA-based embedded systems
The concept of having an integrated circuit (IC) generate its own unique digital signature has broad application in areas such as embedded systems security, and IP/IC counterpiracy...
Jason Helge Anderson
DATE
2007
IEEE
138views Hardware» more  DATE 2007»
15 years 4 months ago
An ADC-BiST scheme using sequential code analysis
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
Erdem Serkan Erdogan, Sule Ozev