135 search results - page 18 / 27 » Analog circuit test based on a digital signature |
77
Voted
IPSN
2007
Springer
15 years 3 months ago
2007
Springer
— Existing sensor network architectures are based on the assumption that data will be polled. Therefore, they are not adequate for long-term battery-powered use in applications t...
73
Voted
ISCAS
2007
IEEE
15 years 4 months ago
2007
IEEE
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...
67
Voted
DATE
1997
IEEE
15 years 1 months ago
1997
IEEE
This paper describes a practical test approach for analog-to-digital converters (ADCs) based on the oscillation-test strategy. The oscillation-test is applied to convert the ADC u...
IOLTS
2007
IEEE
15 years 4 months ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
ISCAS
2005
IEEE
15 years 3 months ago
2005
IEEE
Recent work has shown that the use of switched current methods can provide an effective route to implementation of analog IC functionality using a standard digital CMOS process. Fu...