135 search results - page 21 / 27 » Analog circuit test based on a digital signature |
107
click to vote
ISCAS
2003
IEEE
15 years 7 months ago
2003
IEEE
Improving testability during the early stages of High-Level Synthesis (HLS) has several benefits, including reduced test hardware overhead, reduced test costs, reduced design iter...
142
Voted
INTEGRATION
2006
15 years 1 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
136
click to vote
WCE
2007
15 years 3 months ago
2007
Improving testability during the early stages of High-level synthesis has several advantages including reduced test hardware overhead and design iterations. Recently, BIST techniq...
116
click to vote
JCP
2006
15 years 1 months ago
2006
Abstract-- In this paper a novel pulse sequence testing methodology is presented [22] as an alternative to Time Domain Reflectometry (TDR) for transmission line health condition mo...
118
click to vote
DAC
2007
ACM
16 years 2 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...