135 search results - page 2 / 27 » Analog circuit test based on a digital signature |
VTS
1999
IEEE
15 years 1 months ago
1999
IEEE
This paper presents an algorithm based on testability measurement for test point insertion of mixed-signal circuits. Two transfer function models compatible with analog models are...
CORR
2011
Springer
14 years 4 months ago
2011
Springer
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
ISCAS
2005
IEEE
15 years 3 months ago
2005
IEEE
—We present a Built-In Self-Test (BIST) approach based on direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. DDS with Delta-S...
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KES
1998
Springer
15 years 1 months ago
1998
Springer
The architectural and circuit design aspects of a mixed analog/digital very large scale integration (VLSI) motion detection chip based on models of the insect visual system are des...
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DAC
1998
ACM
15 years 1 months ago
1998
ACM
This papers describes a new, fast and economical methodology to test linear analog circuits based on adaptive algorithms. To the authors knowledge, this is the first time such tec...