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VLSID
2002
IEEE
131views VLSI» more  VLSID 2002»
15 years 10 months ago
Divide-and-Conquer IDDQ Testing for Core-Based System Chips
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
C. P. Ravikumar, Rahul Kumar
IACR
2011
212views more  IACR 2011»
13 years 9 months ago
Fully Homomorphic Encryption without Bootstrapping
We present a radically new approach to fully homomorphic encryption (FHE) that dramatically improves performance and bases security on weaker assumptions. A central conceptual con...
Zvika Brakerski, Craig Gentry, Vinod Vaikuntanatha...
GECCO
2006
Springer
192views Optimization» more  GECCO 2006»
15 years 1 months ago
Optimising cancer chemotherapy using an estimation of distribution algorithm and genetic algorithms
This paper presents a methodology for using heuristic search methods to optimise cancer chemotherapy. Specifically, two evolutionary algorithms - Population Based Incremental Lear...
Andrei Petrovski, Siddhartha Shakya, John A. W. Mc...
DAC
2005
ACM
15 years 10 months ago
MiniBit: bit-width optimization via affine arithmetic
MiniBit, our automated approach for optimizing bit-widths of fixed-point designs is based on static analysis via affine arithmetic. We describe methods to minimize both the intege...
Dong-U Lee, Altaf Abdul Gaffar, Oskar Mencer, Wayn...
VLSID
2009
IEEE
150views VLSI» more  VLSID 2009»
15 years 10 months ago
TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis...