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DAC
2003
ACM
15 years 10 months ago
Test cost reduction for SOCs using virtual TAMs and lagrange multipliers
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
Anuja Sehgal, Vikram Iyengar, Mark D. Krasniewski,...
HPCA
2011
IEEE
14 years 1 months ago
Mercury: A fast and energy-efficient multi-level cell based Phase Change Memory system
― Phase Change Memory (PCM) is one of the most promising technologies among emerging non-volatile memories. PCM stores data in crystalline and amorphous phases of the GST materia...
Madhura Joshi, Wangyuan Zhang, Tao Li
GECCO
2007
Springer
210views Optimization» more  GECCO 2007»
15 years 3 months ago
An application of EDA and GA to dynamic pricing
E-commerce has transformed the way firms develop their pricing strategies, producing shift away from fixed pricing to dynamic pricing. In this paper, we use two different Estim...
Siddhartha Shakya, Fernando Oliveira, Gilbert Owus...
DAC
2008
ACM
15 years 10 months ago
Scan chain clustering for test power reduction
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
EVOW
2007
Springer
15 years 1 months ago
Evaluation of Different Metaheuristics Solving the RND Problem
RND (Radio Network Design) is a Telecommunication problem consisting in covering a certain geographical area by using the smallest number of radio antennas achieving the biggest co...
Miguel A. Vega-Rodríguez, Juan Antonio G&oa...