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TVLSI
2008
150views more  TVLSI 2008»
13 years 5 months ago
Data Memory Subsystem Resilient to Process Variations
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance o...
M. Bennaser, Yao Guo, Csaba Andras Moritz
CCGRID
2006
IEEE
13 years 8 months ago
Biodiversity World: A Problem-Solving Environment for Analysing Biodiversity Patterns
In the Biodiversity World (BDW) project we have created a flexible and extensible Web Services-based Grid environment for biodiversity researchers to solve problems in biodiversity...
Jaspreet Singh Pahwa, Peter Brewer, Tim Sutton, Ch...
DAC
2007
ACM
14 years 7 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
MOBISYS
2006
ACM
14 years 6 months ago
FireWxNet: a multi-tiered portable wireless system for monitoring weather conditions in wildland fire environments
In this paper we present FireWxNet, a multi-tiered portable wireless system for monitoring weather conditions in rugged wildland fire environments. FireWxNet provides the fire fig...
Carl Hartung, Richard Han, Carl Seielstad, Saxon H...
MOBICOM
2004
ACM
13 years 11 months ago
Exploiting medium access diversity in rate adaptive wireless LANs
Recent years have seen the growing popularity of multi-rate wireless network devices (e.g., 802.11a cards) that can exploit variations in channel conditions and improve overall ne...
Zhengrong Ji, Yi Yang, Junlan Zhou, Mineo Takai, R...