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DATE
2008
IEEE
161views Hardware» more  DATE 2008»
15 years 8 months ago
Spatial Correlation Extraction via Random Field Simulation and Production Chip Performance Regression
Statistical timing analysis needs a priori knowledge of process variations. Lack of such a priori knowledge of process variations prevents accurate statistical timing analysis, fo...
Bao Liu
ICASSP
2011
IEEE
14 years 5 months ago
An extension of the ICA model using latent variables
The Independent Component Analysis (ICA) model is extended to the case where the components are not necessarily independent: depending on the value a hidden latent process at the ...
Selwa Rafi, Marc Castella, Wojciech Pieczynski
ITC
1998
IEEE
174views Hardware» more  ITC 1998»
15 years 5 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
DAS
2010
Springer
15 years 6 months ago
Document analysis issues in reading optical scan ballots
Optical scan voting is considered by many to be the most trustworthy option for conducting elections because it provides an independently verifiable record of each voter’s inte...
Daniel P. Lopresti, George Nagy, Elisa H. Barney S...
PR
2006
99views more  PR 2006»
15 years 1 months ago
Class-dependent PCA, MDC and LDA: A combined classifier for pattern classification
Several pattern classifiers give high classification accuracy but their storage requirements and processing time are severely expensive. On the other hand, some classifiers requir...
Alok Sharma, Kuldip K. Paliwal, Godfrey C. Onwubol...