67 search results - page 1 / 14 » Analysis of multibackground memory testing techniques |
AMCS
2010
14 years 12 months ago
2010
DATE
2002
IEEE
15 years 4 months ago
2002
IEEE
: It has always been assumed that fault models in memories are sufficiently precise for specifying the faulty behavior. This means that, given a fault model, it should be possible...
ETS
2007
IEEE
15 years 6 months ago
2007
IEEE
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
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SBMF
2009
Springer
15 years 6 months ago
2009
Springer
In today’s information society, flash memory has become a virtually indispensable component, particularly for mobile devices. In order for mobile devices to operate successfully...
HPCA
2006
IEEE
16 years 2 days ago
2006
IEEE
An important means of validating the design of commercial-grade shared memory multiprocessors is to run a large number of pseudo-random test programs on them. However, when intent...