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» Analytic variations on redundancy rates of renewal processes
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DATE
2008
IEEE
119views Hardware» more  DATE 2008»
14 years 27 days ago
Guiding Circuit Level Fault-Tolerance Design with Statistical Methods
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modifications, such as transistor resizing, and away from expensive system level redunda...
Drew C. Ness, David J. Lilja
DAC
2009
ACM
13 years 11 months ago
Vicis: a reliable network for unreliable silicon
Process scaling has given designers billions of transistors to work with. As feature sizes near the atomic scale, extensive variation and wearout inevitably make margining unecono...
David Fick, Andrew DeOrio, Jin Hu, Valeria Bertacc...
NDSS
2008
IEEE
14 years 24 days ago
Halo: High-Assurance Locate for Distributed Hash Tables
We study the problem of reliably searching for resources in untrusted peer-to-peer networks, where a significant portion of the participating network nodes may act maliciously to...
Apu Kapadia, Nikos Triandopoulos
AUTOMATICA
2008
89views more  AUTOMATICA 2008»
13 years 6 months ago
Dynamic buffer management using optimal control of hybrid systems
This paper studies a general dynamic buffer management problem with one buffer inserted between two interacting components. The component to be controlled is assumed to have multi...
Wei Zhang, Jianghai Hu
ECIS
2000
13 years 7 months ago
Community Health Assessments: A Data Warehousing Approach
- The measurement and assessment of health status in communities throughout the world is a massive information technology challenge. The Comprehensive Assessment for Tracking Commu...
Donald J. Berndt, Alan R. Hevner, James Studnicki