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163
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VTS
1997
IEEE
86views Hardware» more  VTS 1997»
15 years 10 months ago
Methods to reduce test application time for accumulator-based self-test
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
Albrecht P. Stroele, Frank Mayer
153
Voted
CSDA
2006
67views more  CSDA 2006»
15 years 6 months ago
Sensitivity analysis of the strain criterion for multidimensional scaling
Multidimensional scaling (MDS) is a collection of data analytic techniques for constructing configurations of points from dissimilarity information about interpoint distances. Cla...
R. M. Lewis, M. W. Trosset
ECIS
2000
15 years 7 months ago
Software Process Management: An Organizational Learning Perspective
We draw from the quality management and organizational learning literatures to develop a descriptive model of software process management. These literature streams suggest that the...
Thiagarajan Ravichandran, Arun Rai
ICSE
2009
IEEE-ACM
16 years 1 months ago
Automatically capturing source code context of NL-queries for software maintenance and reuse
As software systems continue to grow and evolve, locating code for maintenance and reuse tasks becomes increasingly difficult. Existing static code search techniques using natura...
Emily Hill, Lori L. Pollock, K. Vijay-Shanker
CSMR
2009
IEEE
16 years 1 months ago
Static Security Analysis Based on Input-Related Software Faults
It is important to focus on security aspects during the development cycle to deliver reliable software. However, locating security faults in complex systems is difficult and ther...
Csaba Nagy, Spiros Mancoridis