66 search results - page 3 / 14 » Analyzing Outliers Cautiously |
ICCV
2011
IEEE
12 years 6 months ago
2011
IEEE
Non-blind deconvolution is a key component in image deblurring systems. Previous deconvolution methods assume a linear blur model where the blurred image is generated by a linear ...
ICSM
2009
IEEE
14 years 29 days ago
2009
IEEE
Back in 2001, the MIT announced aspect-oriented programming as a key technology in the next 10 years. Nowadays, 8 years later, AOP is not widely adopted. Several reasons can expla...
DATAMINE
2006
13 years 6 months ago
2006
Efficiently detecting outliers or anomalies is an important problem in many areas of science, medicine and information technology. Applications range from data cleaning to clinica...
ICDE
2009
IEEE
14 years 8 months ago
2009
IEEE
Abstract-- Recent work has demonstrated that readings provided by commodity sensor nodes are often of poor quality. In order to provide a valuable sensory infrastructure for monito...
DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
14 years 1 months ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...