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116
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VTS
2000
IEEE
114views Hardware» more  VTS 2000»
15 years 3 months ago
Detection of CMOS Defects under Variable Processing Conditions
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
Amy Germida, James F. Plusquellic
82
Voted
SIGMETRICS
2000
ACM
15 years 3 months ago
TCP in presence of bursty losses
In this paper we analyze the performance of a TCP-like flow control in a lossy environment. The transmission rate in the control scheme that we consider has a linear growth rate;...
Eitan Altman, Konstantin Avrachenkov, Chadi Baraka...
83
Voted
PODS
1999
ACM
95views Database» more  PODS 1999»
15 years 3 months ago
Minimal Data Upgrading to Prevent Inference and Association
Despite advances in recent years in the area of mandatory access control in database systems, today's information repositories remain vulnerable to inference and data associa...
Steven Dawson, Sabrina De Capitani di Vimercati, P...
158
Voted
ARTS
1999
Springer
15 years 3 months ago
ProbVerus: Probabilistic Symbolic Model Checking
Model checking can tell us whether a system is correct; probabilistic model checking can also tell us whether a system is timely and reliable. Moreover, probabilistic model checkin...
Vicky Hartonas-Garmhausen, Sérgio Vale Agui...
113
Voted
CONCUR
1999
Springer
15 years 3 months ago
Partial Order Reduction for Model Checking of Timed Automata
Abstract. The paper presents a partial order reduction method applicable to networks of timed automata. The advantage of the method is that it reduces both the number of explored c...
Marius Minea