37 search results - page 5 / 8 » Application of deterministic logic BIST on industrial circui... |
ETS
2006
IEEE
15 years 3 months ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
ICCAD
1996
IEEE
15 years 1 months ago
1996
IEEE
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
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ASPLOS
2009
ACM
15 years 10 months ago
2009
ACM
Although chip-multiprocessors have become the industry standard, developing parallel applications that target them remains a daunting task. Non-determinism, inherent in threaded a...
GLVLSI
2006
IEEE
15 years 3 months ago
2006
IEEE
In this paper we have applied statistical sizing in an industrial setting. Efficient implementation of the statistical sizing algorithm is achieved by utilizing a dedicated interi...
DAC
2008
ACM
15 years 10 months ago
2008
ACM
As integrated circuit technology plumbs ever greater depths in the scaling of feature sizes, maintaining the paradigm of deterministic Boolean computation is increasingly challeng...