377 search results - page 11 / 76 » Application of heuristic methods for conformance test select... |
DAGM
2007
Springer
15 years 4 months ago
2007
Springer
Research on EEG based brain-computer-interfaces (BCIs) aims at steering devices by thought. Even for simple applications, BCIs require an extremely effective data processing to wo...
NIPS
2007
14 years 11 months ago
2007
A situation where training and test samples follow different input distributions is called covariate shift. Under covariate shift, standard learning methods such as maximum likeli...
VTS
2008
IEEE
15 years 4 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
ISQED
2003
IEEE
15 years 3 months ago
2003
IEEE
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
ICPPW
2002
IEEE
15 years 2 months ago
2002
IEEE
This paper presents a methodology for aiding a scientific programmer to evaluate the performance of parallel programs on advanced architectures. It applies well-defined design o...