5570 search results - page 128 / 1114 » Applications of Fair Testing |
137
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VLSID
2002
IEEE
16 years 3 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
103
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VTS
2000
IEEE
15 years 8 months ago
2000
IEEE
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
171
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GECCO
2008
Springer
15 years 4 months ago
2008
Springer
Evolutionary testing denotes the use of evolutionary algorithms, e.g., Genetic Algorithms (GAs), to support various test automation tasks. Since evolutionary algorithms are heuris...
153
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IUI
2012
ACM
13 years 11 months ago
2012
ACM
As applications are developed, functional tests ensure they continue to function as expected. Nowadays, functional testing is mostly done manually, with human testers verifying a ...
123
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VLSID
2002
IEEE
16 years 3 months ago
2002
IEEE
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...