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GI
2009
Springer
14 years 9 months ago
A Generic Approach for Modeling Test Case Priorities with Applications for Test Development and Execution
: This contribution addresses systematic test development methods to include an algorithm to retrieve a test suite execution control in order to run test cases with high priority e...
Andreas Hoffmann, Axel Rennoch, Ina Schieferdecker...
80
Voted
DAC
1999
ACM
16 years 21 days ago
Improving the Test Quality for Scan-Based BIST Using a General Test Application Scheme
Huan-Chih Tsai, Kwang-Ting Cheng, Sudipta Bhawmik
43
Voted
DT
2007
48views more  DT 2007»
14 years 11 months ago
Chemical and Biological Applications of Digital-Microfluidic Devices
Richard B. Fair, Andrey Khlystov, Tina D. Tailor, ...
DATE
2002
IEEE
135views Hardware» more  DATE 2002»
15 years 4 months ago
Reducing Test Application Time Through Test Data Mutation Encoding
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
Sherief Reda, Alex Orailoglu
ITC
1998
IEEE
95views Hardware» more  ITC 1998»
15 years 4 months ago
Native mode functional test generation for processors with applications to self test and design validation
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
Jian Shen, Jacob A. Abraham