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DATE
2003
IEEE
104views Hardware» more  DATE 2003»
15 years 9 months ago
A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories
In this paper we present a microprocessor-based approach suitable for embedded flash memory testing in a System-on-achip (SOC) environment. The main novelty of the approach is the...
Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza ...
95
Voted
ITC
2003
IEEE
143views Hardware» more  ITC 2003»
15 years 9 months ago
A Case Study of IR-Drop in Structured At-Speed Testing
At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful applic...
Jayashree Saxena, Kenneth M. Butler, Vinay B. Jaya...
VTS
1999
IEEE
71views Hardware» more  VTS 1999»
15 years 8 months ago
Test Generation for Ground Bounce in Internal Logic Circuitry
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer
132
Voted
ECOOP
2007
Springer
15 years 7 months ago
Automation of Refactoring and Refactoring Suggestions for TTCN-3 Test Suites. The TRex TTCN-3 Refactoring and Metrics Tool
Refactoring is not only useful for source code of implementations, but as well for test specifications. The open source TRex tool automates the application of refactorings and the ...
Helmut Neukirchen, Benjamin Zeiss
116
Voted
SOQUA
2004
15 years 5 months ago
Test Oracles Using Statistical Methods
Abstract: The oracle problem is addressed for random testing and testing of randomized software. The presented Statistical Oracle is a Heuristic Oracle using statistical methods, e...
Johannes Mayer, Ralph Guderlei