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DATE
1999
IEEE
120views Hardware» more  DATE 1999»
15 years 8 months ago
FreezeFrame: Compact Test Generation Using a Frozen Clock Strategy
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
Yanti Santoso, Matthew C. Merten, Elizabeth M. Rud...
162
Voted
AOSE
2008
Springer
15 years 5 months ago
Experimental Evaluation of Ontology-Based Test Generation for Multi-agent Systems
Abstract. Software agents are a promising technology for today's complex, distributed systems. Methodologies and techniques that address testing and reliability of multi agent...
Cu D. Nguyen, Anna Perini, Paolo Tonella
CORR
2010
Springer
171views Education» more  CORR 2010»
15 years 3 months ago
Reliable Mining of Automatically Generated Test Cases from Software Requirements Specification (SRS)
Writing requirements is a two-way process. In this paper we use to classify Functional Requirements (FR) and Non Functional Requirements (NFR) statements from Software Requirement...
Lilly Raamesh, G. V. Uma
ICSE
2009
IEEE-ACM
15 years 1 months ago
Configuration aware prioritization techniques in regression testing
Configurable software lets users customize applications in many ways, and is becoming increasingly prevalent. Regression testing is an important but expensive way to build confide...
Xiao Qu
CORR
2011
Springer
200views Education» more  CORR 2011»
14 years 10 months ago
Sequential Analysis in High Dimensional Multiple Testing and Sparse Recovery
—This paper studies the problem of high-dimensional multiple testing and sparse recovery from the perspective of sequential analysis. In this setting, the probability of error is...
Matt Malloy, Robert Nowak