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CCECE
2006
IEEE
15 years 9 months ago
AOP Extension for Security Testing of Programs
The purpose of this paper is to use the aspect-oriented programming (AOP) paradigm for security testing. AOP allows security experts to develop and inject separate modules for con...
Nadia Belblidia, Mourad Debbabi, Aiman Hanna, Zhen...
130
Voted
ETS
2006
IEEE
119views Hardware» more  ETS 2006»
15 years 9 months ago
On-Chip Test Generation Using Linear Subspaces
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
Ramashis Das, Igor L. Markov, John P. Hayes
ICMCS
2006
IEEE
148views Multimedia» more  ICMCS 2006»
15 years 9 months ago
Hierarchical Load Testing Architecture using Large Scale Virtual Clients
In this work, we develop a hierarchical load testing architecture using large scale virtual clients to reduce the testing time and ensure the stability of the server for distribut...
Bum Lim, Jin Kim, Kwang Shim
168
Voted
SEKE
2005
Springer
15 years 9 months ago
A State-Based Approach to Testing Aspect-Oriented Programs
This paper presents a state-based approach to testing aspect-oriented programs. Aspectual state models, as an extension to the testable FREE state model of classes, are exploited ...
Dianxiang Xu, Weifeng Xu, Kendall E. Nygard
137
Voted
DATE
2003
IEEE
96views Hardware» more  DATE 2003»
15 years 9 months ago
Test Data Compression: The System Integrator's Perspective
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola N...