5570 search results - page 168 / 1114 » Applications of Fair Testing |
96
Voted
ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
Electrical testing of MicroElectroMechanical Systems (MEMS) can take on many different forms including wafer probing, electrical trimming, final test at temperatures, engineering ...
127
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ITC
2003
IEEE
15 years 9 months ago
2003
IEEE
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we ha...
115
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EUROCRYPT
2003
Springer
15 years 9 months ago
2003
Springer
Abstract. We study statistical tests with binary output that rarely outputs one, which we call nearly one-sided statistical tests. We provide an efficient reduction establishing im...
150
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DFT
2002
IEEE
15 years 8 months ago
2002
IEEE
Many digital circuits have constraints on the logic values a set of signal lines can have. In this paper, we present two new techniques for detecting the illegal combinations of l...
121
Voted
MTDT
2000
IEEE
15 years 8 months ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...