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ISESE
2002
IEEE
15 years 9 months ago
Elimination of Crucial Faults by a New Selective Testing Method
Recent software systems contain a lot of functions to provide various services. According to this tendency, software testing becomes more difficult than before and cost of testing...
Masayuki Hirayama, Tetsuya Yamamoto, Jiro Okayasu,...
ICCAD
1999
IEEE
86views Hardware» more  ICCAD 1999»
15 years 8 months ago
A framework for testing core-based systems-on-a-chip
Available techniques for testing core-based systems-on-a-chip (SOCs) do not provide a systematic means for synthesising low-overhead test architectures and compact test solutions....
Srivaths Ravi, Ganesh Lakshminarayana, Niraj K. Jh...
ITC
1997
IEEE
73views Hardware» more  ITC 1997»
15 years 8 months ago
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
Indradeep Ghosh, Niraj K. Jha, Sujit Dey
119
Voted
HYBRID
2007
Springer
15 years 10 months ago
Robust Test Generation and Coverage for Hybrid Systems
Abstract. Testing is an important tool for validation of the system design and its implementation. Model-based test generation allows to systematically ascertain whether the system...
A. Agung Julius, Georgios E. Fainekos, Madhukar An...
139
Voted
FATES
2005
Springer
15 years 9 months ago
Model-Based Testing Through a GUI
Abstract. So far, model-based testing approaches have mostly been used in testing through various kinds of APIs. In practice, however, testing through a GUI is another equally impo...
Antti Kervinen, Mika Maunumaa, Tuula Pää...