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121
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ICCAD
2001
IEEE
84views Hardware» more  ICCAD 2001»
16 years 26 days ago
On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits
Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’...
Seiji Kajihara, Kohei Miyase
IUI
2010
ACM
15 years 10 months ago
Lowering the barriers to website testing with CoTester
In this paper, we present CoTester, a system designed to decrease the difficulty of testing web applications. CoTester allows testers to create test scripts that are represented ...
Jalal Mahmud, Tessa Lau
VLSID
2005
IEEE
120views VLSI» more  VLSID 2005»
15 years 9 months ago
On Finding Consecutive Test Vectors in a Random Sequence for Energy-Aware BIST Design
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
Sheng Zhang, Sharad C. Seth, Bhargab B. Bhattachar...
WER
2004
Springer
15 years 9 months ago
Structural Testing with Use Cases
Understanding how a user interacts with a system is important if the goal is to deliver a product that meets the user's needs. Use cases constitute a primary source of require...
Adriana Carniello, Mario Jino, Marcos Lordello Cha...
119
Voted
CSMR
2003
IEEE
15 years 9 months ago
Using Observation and Refinement to Improve Distributed Systems Test
Testing a distributed system is difficult. Good testing depends on both skill and understanding the system under test. We have developed a method to observe the system at the CORB...
Johan Moe, David A. Carr, Mikael Patel