5570 search results - page 199 / 1114 » Applications of Fair Testing |
136
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ISSRE
2010
IEEE
15 years 2 months ago
2010
IEEE
—Large scale systems (LSS) contain multiple subsystems that interact across multiple nodes in sometimes unforeseen and complicated ways. As a result, pinpointing the subsystems t...
142
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ACSAC
2010
IEEE
15 years 2 months ago
2010
IEEE
New security architectures are difficult to prototype and test at the design stage. Fine-grained monitoring of the interactions between hardware, the operating system, and applica...
173
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ET
2010
15 years 1 months ago
2010
Modern mixed-signal/RF circuits with a digital calibration capability could achieve significant performance improvement through calibration. However, the calibration process often ...
126
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ICCAD
2006
IEEE
16 years 27 days ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
136
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ETS
2006
IEEE
15 years 10 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...