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DAC
1997
ACM
15 years 8 months ago
ATPG for Heat Dissipation Minimization During Scan Testing
An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...
Seongmoon Wang, Sandeep K. Gupta
ATS
2001
IEEE
172views Hardware» more  ATS 2001»
15 years 7 months ago
A Built-in Self-Test and Self-Diagnosis Scheme for Heterogeneous SRAM Clusters
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...
Chih-Wea Wang, Ruey-Shing Tzeng, Chi-Feng Wu, Chih...
ISTCS
1995
Springer
15 years 7 months ago
Some Improvements to Total Degree Tests
A low-degree test is a collection of simple, local rules for checking the proximity of an arbitrary function to a lowdegree polynomial. Each rule depends on the function’s value...
Katalin Friedl, Madhu Sudan
FORTEST
2008
15 years 5 months ago
Testing Data Types Implementations from Algebraic Specifications
Algebraic specifications of data types provide a natural basis for testing data types implementations. In this framework, the conformance relation is based on the satisfaction of a...
Marie-Claude Gaudel, Pascale Le Gall
CSDA
2006
90views more  CSDA 2006»
15 years 4 months ago
Comparing two binary diagnostic tests in the presence of verification bias
The comparison of the accuracy of two binary diagnostic tests has traditionally required knowledge of the real state of the disease in all of the patients in the sample via the ap...
José Antonio Roldán Nofuentes, Juan ...