An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...
A low-degree test is a collection of simple, local rules for checking the proximity of an arbitrary function to a lowdegree polynomial. Each rule depends on the function’s value...
Algebraic specifications of data types provide a natural basis for testing data types implementations. In this framework, the conformance relation is based on the satisfaction of a...
The comparison of the accuracy of two binary diagnostic tests has traditionally required knowledge of the real state of the disease in all of the patients in the sample via the ap...