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» Applications of Fair Testing
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168
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MTV
2005
IEEE
138views Hardware» more  MTV 2005»
15 years 9 months ago
Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...
Paolo Bernardi, Ernesto Sánchez, Massimilia...
ITC
2003
IEEE
176views Hardware» more  ITC 2003»
15 years 9 months ago
Instruction Based BIST for Board/System Level Test of External Memories and Internconnects
ct This paper describes a general technique to test external memory/caches and memory interconnects using on-chip logic. Such a test methodology is expected to significantly reduc...
Olivier Caty, Ismet Bayraktaroglu, Amitava Majumda...
ISSTA
1993
ACM
15 years 8 months ago
Faults on Its Sleeve: Amplifying Software Reliability Testing
Most of the effort that goes into improving the quality of software paradoxically does not lead to quantitative, measurable quality. Software developers and quality-assurance orga...
Richard G. Hamlet, Jeffrey M. Voas
ATS
2004
IEEE
116views Hardware» more  ATS 2004»
15 years 7 months ago
Testing for Missing-Gate Faults in Reversible Circuits
Logical reversibility occurs in low-power applications and is an essential feature of quantum circuits. Of special interest are reversible circuits constructed from a class of rev...
John P. Hayes, Ilia Polian, Bernd Becker
SMA
2010
ACM
164views Solid Modeling» more  SMA 2010»
15 years 4 months ago
Topologically guaranteed univariate solutions of underconstrained polynomial systems via no-loop and single-component tests
We present an algorithm which robustly computes the intersection curve(s) of an under-constrained piecewise polynomial system consisting of n equations with n + 1 unknowns. The so...
Michael Barton, Gershon Elber, Iddo Hanniel