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ASM
2005
ASM
15 years 9 months ago
Modeling and Testing Hierarchical GUIs
Abstract. This paper presents a new approach to model and test hierarchical Graphical User Interfaces (GUIs). We exploit the structure of Hierarchical Finite State Machines (HFSMs)...
Ana Paiva, Nikolai Tillmann, João C. P. Far...
ATS
2000
IEEE
145views Hardware» more  ATS 2000»
15 years 8 months ago
Compaction-based test generation using state and fault information
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
150
Voted
DSN
2000
IEEE
15 years 8 months ago
Robustness Testing of the Microsoft Win32 API
Although Microsoft Windows is being deployed in mission-critical applications, little quantitative data has been published about its robustness. We present the results of executin...
Charles P. Shelton, Philip Koopman, Kobey Devale
ICPR
2000
IEEE
15 years 8 months ago
Nonparametric Markov Random Field Model Analysis of the MeasTex Test Suite
This paper looks at the nonparametric, multiscale, Markov Random Field (MRF) model and its application in classifying the MeasTex Test Suite. The MeasTex Test Suite is a standard ...
Rupert Paget, I. Dennis Longstaff
142
Voted
CORR
2010
Springer
210views Education» more  CORR 2010»
15 years 4 months ago
Test Case Generation for Object-Oriented Imperative Languages in CLP
Testing is a vital part of the software development process. Test Case Generation (TCG) is the process of automatically generating a collection of test-cases which are applied to ...
Miguel Gómez-Zamalloa, Elvira Albert, Germ&...