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ICCD
2008
IEEE
202views Hardware» more  ICCD 2008»
16 years 2 months ago
CrashTest: A fast high-fidelity FPGA-based resiliency analysis framework
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
Andrea Pellegrini, Kypros Constantinides, Dan Zhan...
AMMA
2009
Springer
15 years 12 months ago
Turing Trade: A Hybrid of a Turing Test and a Prediction Market
Abstract. We present Turing Trade, a web-based game that is a hybrid of a Turing test and a prediction market. In this game, there is a mystery conversation partner, the “target,...
Joseph Farfel, Vincent Conitzer
KBSE
2007
IEEE
15 years 11 months ago
Scalable automatic test data generation from modeling diagrams
We explore the automatic generation of test data that respect constraints expressed in the Object-Role Modeling (ORM) language. ORM is a popular conceptual modeling language, prim...
Yannis Smaragdakis, Christoph Csallner, Ranjith Su...
VCIP
2003
163views Communications» more  VCIP 2003»
15 years 6 months ago
Comparing subjective video quality testing methodologies
International recommendations for subjective video quality assessment (e.g., ITU-R BT.500-11) include specifications for how to perform many different types of subjective tests. S...
Margaret H. Pinson, Stephen Wolf
EVOW
2001
Springer
15 years 9 months ago
ARPIA: A High-Level Evolutionary Test Signal Generator
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...