5570 search results - page 32 / 1114 » Applications of Fair Testing |
120
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DFT
2002
IEEE
15 years 4 months ago
2002
IEEE
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
115
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ACL
2009
14 years 9 months ago
2009
We compare the CCG parser of Clark and Curran (2007) with a state-of-the-art Penn Treebank (PTB) parser. An accuracy comparison is performed by converting the CCG derivations into...
ICST
2009
IEEE
15 years 6 months ago
2009
IEEE
Software products released into the field typically have some number of residual defects that either were not detected or could not have been detected during testing. This may be...
SIU
2002
14 years 11 months ago
2002
Abstract. In order to verify and test the performance of new packing algorithms relative to existing algorithms, test problems are needed. The scope of published test instances for...
181
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SIGMOD
2006
ACM
15 years 12 months ago
2006
ACM
Testing of database applications is crucial for ensuring high software quality as undetected faults can result in unrecoverable data corruption. The problem of database applicatio...