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ATS
2005
IEEE
118views Hardware» more  ATS 2005»
15 years 5 months ago
Partial Gating Optimization for Power Reduction During Test Application
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
Mohammed ElShoukry, Mohammad Tehranipoor, C. P. Ra...
TSD
2000
Springer
15 years 3 months ago
Testing a Word Analysis System for Reliable and Sense-Conveying Hyphenation and Other Applications
In this article, we present a test environment for a word analysis system that is used for reliable and sense-conveying hyphenation of German words. A crucial task is the hyphenati...
Martin Schönhacker, Gabriele Kodydek
SIGSOFT
2008
ACM
16 years 17 days ago
Inter-context control-flow and data-flow test adequacy criteria for nesC applications
NesC is a programming language for applications that run on top of networked sensor nodes. Such an application mainly uses an interrupt to trigger a sequence of operations, known ...
Zhifeng Lai, Shing-Chi Cheung, Wing Kwong Chan
ICSE
2000
IEEE-ACM
15 years 3 months ago
An empirical study of regression test application frequency
Regression testing is an expensive maintenance process used to revalidate modified software. Regression test selection (RTS) techniques attempt to reduce the cost of regression te...
Jung-Min Kim, Adam A. Porter, Gregg Rothermel
ICSM
2005
IEEE
15 years 5 months ago
Rapid "Crash Testing" for Continuously Evolving GUI-Based Software Applications
Several rapid-feedback-based quality assurance mechanisms are used to manage the quality of continuously evolving software. Even though graphical user interfaces (GUIs) are one of...
Qing Xie, Atif M. Memon