5570 search results - page 73 / 1114 » Applications of Fair Testing |
128
Voted
GECCO
2004
Springer
15 years 8 months ago
2004
Springer
In this study, a new mechanism that adapts the mutation rate for each locus on the chromosomes, based on feedback obtained from the current population is proposed. Through tests us...
112
Voted
DATE
2007
IEEE
15 years 9 months ago
2007
IEEE
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
135
click to vote
ISOLA
2004
Springer
15 years 8 months ago
2004
Springer
The article is concerned with an approach to model based test development for large software systems. The approach presented is a part of UniTesK test development technology, which...
128
click to vote
VTS
2008
IEEE
15 years 9 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
107
Voted
SAC
2009
ACM
15 years 10 months ago
2009
ACM
This paper presents a methodology for interoperability testing based on contextual signatures and passive testing with invariants. The concept of contextual signature offers a fra...