5570 search results - page 74 / 1114 » Applications of Fair Testing |
115
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JSA
2000
15 years 3 months ago
2000
As the density of VLSI circuits increases it becomes attractive to integrate dedicated test logic on a chip. This Built-in Self-Test (BIST) approach not only offers economic benef...
127
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INFOCOM
2007
IEEE
15 years 9 months ago
2007
IEEE
— Multicast is an efficient means of transmitting the same content to multiple receivers while minimizing network resource usage. Applications that can benefit from multicast s...
127
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PDPTA
2004
15 years 4 months ago
2004
File-sharing applications remain today the most representative and popular realization of the Peerto-Peer paradigm. Large objects receive an increasing amount of interest in such s...
101
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VTS
2007
IEEE
15 years 9 months ago
2007
IEEE
When a test set size is larger than desired, some patterns must be dropped. This paper presents a systematic method to reduce test set size; the method reorders a test set using t...
118
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DATE
2007
IEEE
15 years 9 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...