5570 search results - page 75 / 1114 » Applications of Fair Testing |
120
Voted
DATE
2009
IEEE
15 years 10 months ago
2009
IEEE
– In this paper, we present an open architecture Virtual Test Environment (VTE) which can be easily integrated into various modularized Automatic Test Systems (ATS) compliant to ...
108
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ISQED
2003
IEEE
15 years 8 months ago
2003
IEEE
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
112
Voted
ECBS
2010
IEEE
15 years 8 months ago
2010
IEEE
The Unified Modeling Language (UML) is the standard to specify the structure and behaviour of software systems. The created models are a constitutive part of the software speci...
121
Voted
DATE
2008
IEEE
15 years 9 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
114
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VTS
2003
IEEE
15 years 8 months ago
2003
IEEE
1 We propose a test resource partitioning and optimization technique for core-based designs. Our technique includes test set selection and test resource floor-planning with the ai...