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139
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ATS
2010
IEEE
15 years 3 days ago
2010
IEEE
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
156
Voted
ATS
2005
IEEE
15 years 9 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
137
Voted
IEEEPACT
2009
IEEE
15 years 10 months ago
2009
IEEE
—Software testing is hard. The emergence of multicore architectures and the proliferation of bugprone multithreaded software makes testing even harder. To this end, researchers h...
147
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GECCO
2003
Springer
15 years 8 months ago
2003
Springer
Evolutionary Testing (ET) has been shown to be very successful for testing real world applications [10]. The original ET approach focusesonsearching for a high coverage of the test...
134
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KDD
2000
ACM
15 years 7 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...